MicroTESK @ DATE 2017

Conferences
MicroTESK together with a Spin-based extension for verifying cache coherency mechanisms was presented at the University Booth exhibition of the Design, Automation and Test in Europe Conference (DATE) held in Lausanne, Switzerland on March 27-31, 2017. DATE is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems.
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MicroTESK @ ISPRAS OPEN 2016

Conferences
MicroTESK for ARMv8 was presented at the ISPRAS OPEN Conference held in Moscow, December 1-2, 2016. A. Kamkin, A. Kotsynyak, A. Protsenko, A. Tatarnikov, M. Chupilko. MicroTESK-Based Test Program Generator for the ARMv8 Architecture. The ISPRAS Open Conference is the annual event organized by Institute for System Programming of the Russian Academy of Sciences.
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MicroTESK for MIPS64 @ CEE-SECR 2016

Conferences
MicroTESK for MIPS64 was presented at the Central & Eastern European Software Engineering Conference in Russia (CEE-SECR) held in Moscow, Digital October Center, October 28–29, 2016. Alexander Kamkin. Automated Development of Test Program Generators for Microprocessors on the Example of MIPS (in Russian). http://2016.secr.ru/lang/en/program/submitted-presentations/automated-development-of-test-program-generators-for-microprocessors-on-the-example-of-mips SECR is one of the brightest annual IT events in Russia. Over the years it has become one of the largest platforms for sharing experience, obtaining knowledge and networking. One of the important conference features is SECR scope. Software development process is considered in all its aspects: technologies, management, education, HR, business, etc.
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MicroTESK @ EWDTS 2016

Conferences
MicroTESK was presented at the IEEE East-West Design & Test Symposium (EWDTS) held in Yerevan, Armenia on October 14-17, 2016. We made several presentations including one related to MicroTESK: A. Tatarnikov. An Approach to Instruction Stream Generation for Functional Verification of Microprocessor Designs. The main target of the EWDTS is to exchange experiences between scientists and technologies from Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. The symposium is typically held in countries around East Europe, the Black Sea, the Balkans and Central Asia region.
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MicroTESK @ MES 2016

Conferences
MicroTESK was presented at the 7th All-Russia Science & Technology Conference 'Problems of Advanced Micro- and Nanoelectronic Systems Development' (MES) held in Zelenograd, Moscow on October 3-7, 2016. We made two presentations (in Russian): A. Tatarnikov. Combinatorial Test Program Generation for Microprocessors Based on Formal Specifications of Instruction Set Architecture. A. Kamkin, A. Kotsynyak. Specification-Based Test Program Generation for MIPS64 Memory Management Units. MES is the biggest Russian conference devoted to urgent issues of design automation of microelectronic systems, SoCs, IP-blocks and a new element base of micro-and nanoelectronics.
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MicroTESK @ ICAM 2016

Conferences
MicroTESK will be presented at the 11th International Conference on Computer-Aided Technologies in Applied Mathematics (ICAM) to be held in Ekaterinburg, Russia on June 6-10, 2016. We will make the following presentation: A. Tatarnikov. Constructing Behavioral Models of Microprocessors for Test Program Generation. The aim of ICAM is to provide opportunities to bring together practitioners and researchers in the field of applied mathematics and its applications.
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MicroTESK for ARMv8 @ DATE 2016

Conferences
MicroTESK for ARMv8 will be presented at the University Booth exhibition of the Design, Automation and Test in Europe Conference (DATE) to be held on March 14-18 in Dresden, Germany. DATE is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems.  
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