MicroTESK @ MES 2016

MicroTESK was presented at the 7th All-Russia Science & Technology Conference ‘Problems of Advanced Micro- and Nanoelectronic Systems Development’ (MES) held in Zelenograd, Moscow on October 3-7, 2016.

We made two presentations (in Russian):

A. Tatarnikov. Combinatorial Test Program Generation for Microprocessors Based on Formal Specifications of Instruction Set Architecture.

A. Kamkin, A. Kotsynyak. Specification-Based Test Program Generation for MIPS64 Memory Management Units.

MES is the biggest Russian conference devoted to urgent issues of design automation of microelectronic systems, SoCs, IP-blocks and a new element base of micro-and nanoelectronics.